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Statistical Analysis of Metal-Molecule Contacts in Alkyl Molecular Junctions: Sulfur versus Selenium End-Group

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We fabricated a large number of microscale via-hole structure molecular devices (2240 devices) using octane-Se [CH3(CH2)7Se] self assembled monolayers (SAMs) and compared their charge transport properties with those of octane-S [CH3(CH2)7S] SAMs molecular devices in terms of current density, resistance, and tunneling decay coefficient. The device yield of the "working" octane-Se molecular devices was found to be ∼1.7% (38/2240), which was similar to the yield of ∼1.1% (50/4480) for octane-S devices. Our statistical analysis revealed that for octane-Se devices the tunneling current was slightly smaller and the low-bias resistance and decay coefficient were slightly larger than those for octane-S devices. The standard deviations of these transport parameters of octane-Se devices were found to be broader than those for octane-S devices due to irregularity of the binding sites of octane-Se on Au electrode surface.


Document Type: Research Article


Publication date: December 1, 2009

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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