Improving Accuracy of Sample Surface Topography by Atomic Force Microscopy
Abstract:We describe method for improving the accuracy of sample surface topography by atomic force microscopy (AFM). It takes into account the effect of the AFM tip shape and image reconstruction on the acquired AFM images. The dilation effect due to the use of a finite-sized tip shape can be minimized by using a sharp AFM tip and scanning at the most symmetric direction of tip geometry. Reconstruction of AFM image could produce more accurate sample surface features. The method is useful to AFM measurement and is significant because AFM has become a fundamental tool in nanoscience and nanotechnology with multiple applications in a wide range of disciplines ranging from biology to physics and material science.
Document Type: Short Communication
Publication date: 2009-10-01
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- Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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