Ultra-High Resolution Nano-Characterisation and Analysis Using Advanced S/TEM
Authors: Hubert, Dominique H.W.; Freitag, Bert; Stokes, Debbie J.; Tang, Dong; Van Cappellen, Eric
Source: Journal of Nanoscience and Nanotechnology, Volume 9, Number 2, February 2009 , pp. 1051-1053(3)
Publisher: American Scientific Publishers
Abstract:As the frontiers of nanotechnology are expanded ever further, so too we must push back the boundaries of imaging and analysis. The need for tools that can deliver new, ultra-high resolution information is driving the development of electron microscopy and spectroscopy to the extremes of performance. For example, aberration-corrected TEM (transmission electron microscopy) and STEM (scanning transmission electron microscopy) gives us the ability to work at sub-angstrom length-scales. Combine this capability with an unprecedented electron beam energy resolution, and spectroscopy at the atomic level revealing knowledge about inter-atomic bonding becomes a fact. This enables full characterization of chemical composition, electronic structure and mechanical properties. In addition, there is scope for capturing time-resolved structural transformations with sub-nanometer detail, enabling us to directly observe and understand the dynamics of a range of chemical processes in situ.
Document Type: Research article
Publication date: 2009-02-01
- Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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