Ultra-High Resolution Nano-Characterisation and Analysis Using Advanced S/TEM
As the frontiers of nanotechnology are expanded ever further, so too we must push back the boundaries of imaging and analysis. The need for tools that can deliver new, ultra-high resolution information is driving the development of electron microscopy and spectroscopy to the extremes of performance. For example, aberration-corrected TEM (transmission electron microscopy) and STEM (scanning transmission electron microscopy) gives us the ability to work at sub-angstrom length-scales. Combine this capability with an unprecedented electron beam energy resolution, and spectroscopy at the atomic level revealing knowledge about inter-atomic bonding becomes a fact. This enables full characterization of chemical composition, electronic structure and mechanical properties. In addition, there is scope for capturing time-resolved structural transformations with sub-nanometer detail, enabling us to directly observe and understand the dynamics of a range of chemical processes in situ.
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Document Type: Research Article
Publication date: 01 February 2009
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- Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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