Skip to main content

Ultra-High Resolution Nano-Characterisation and Analysis Using Advanced S/TEM

Buy Article:

$113.00 plus tax (Refund Policy)

Abstract:

As the frontiers of nanotechnology are expanded ever further, so too we must push back the boundaries of imaging and analysis. The need for tools that can deliver new, ultra-high resolution information is driving the development of electron microscopy and spectroscopy to the extremes of performance. For example, aberration-corrected TEM (transmission electron microscopy) and STEM (scanning transmission electron microscopy) gives us the ability to work at sub-angstrom length-scales. Combine this capability with an unprecedented electron beam energy resolution, and spectroscopy at the atomic level revealing knowledge about inter-atomic bonding becomes a fact. This enables full characterization of chemical composition, electronic structure and mechanical properties. In addition, there is scope for capturing time-resolved structural transformations with sub-nanometer detail, enabling us to directly observe and understand the dynamics of a range of chemical processes in situ.

Keywords: ABERRATION CORRECTED IMAGING; CHEMICAL COMPOSITION; ELECTRONIC STRUCTURE; MECHANICAL PROPERTIES; SUB-ANGSTROM RESOLUTION

Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jnn.2009.C085

Publication date: February 1, 2009

More about this publication?
  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
  • Editorial Board
  • Information for Authors
  • Subscribe to this Title
  • Terms & Conditions
  • ingentaconnect is not responsible for the content or availability of external websites
asp/jnn/2009/00000009/00000002/art00085
dcterms_title,dcterms_description,pub_keyword
6
5
20
40
5

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more