Microstructural Properties of Phase-Change Ge2Sb2Te5 Nanoparticles Grown by Pulsed-Laser Ablation
Authors: Jeong, A. R.; Yoon, H. R.; Oh, Y. J.; Kim, T. Y.; Jo, W.; Kim, M.
Source: Journal of Nanoscience and Nanotechnology, Volume 9, Number 2, February 2009 , pp. 901-904(4)
Publisher: American Scientific Publishers
Abstract:We have introduced in-situ growth of Ge2Sb2Te5 (GST) nanoparticles with 10 nm of average diameter by pulsed laser ablation directlyon Pt/Ir-coated AFM tips and investigated their microstructure and phase formation using scanning and transmission electron microscopy. In addition, Fourier transform analysis of electron micrographs discloses the crystal structure of the Ge2Sb2Te5 phase which has a lattice constant with ∼6 Å like bulk value of face-centered cubic and hexagonal structure.
Document Type: Research Article
Publication date: February 2009
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