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Contact Behaviors Between Zinc Oxide Nanowires and Metal Electrodes

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The paper reports studies on contact behaviors between semiconducting zinc oxide nanowires and metal electrodes. Focused ion beam (FIB) is employed to deposit Pt on the contact between the nanowire and the metal electrodes for eliminating the Schottky barriers. By depositing Pt on one or two contacts of nanowires, we construct three types of nanostructure to investigate the contact behaviors. The experimental results reveal that FIB technology is an effective way to eliminate the contact barriers. We also establish a electric model to fit and predict the IV characteristics for a metal-semiconductor-metal structure.


Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jnn.2009.C041

Publication date: February 1, 2009

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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