Formation and Microstructural Properties of Locally Distributed ZnSiO3 Nanoparticles Embedded in a SiO2 Layer by Using a Focused Electron Beam
Authors: Shin, J. W.; No, Y. S.; Kim, T. W.; Choi, W. K.
Source: Journal of Nanoscience and Nanotechnology, Volume 8, Number 10, October 2008 , pp. 5566-5570(5)
Publisher: American Scientific Publishers
Abstract:Locally distributed crystalline ZnSiO3 nanoparticles embedded in a SiO2 layer inserted between the ZnO thin film and the Si substrate were formed using transmission electron microscopy (TEM) with a focused electron beam irradiation process. High-resolution TEM (HRTEM) images and energy dispersive X-ray spectroscopy (EDS) profiles showed that ZnSiO3 nanocrystals with a size of approximately 6 nm were formed in the SiO2 layer. The formation mechanisms of the ZnSiO3 nanocrystals in the SiO2 layer are described on the basis of the HRTEM images and the EDS profiles.
Document Type: Research Article
Publication date: October 2008
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