Electro-Thermal Analysis of Nano Scale PRAM with U Shaped Bottom Electrode
In this paper, we have investigated the phase change memory device with U-shaped bottom electrode using three-dimensional finite element analysis tool. From the simulation, the reset current of PRAM with U-shaped bottom electrode is greatly reduced, compared with the conventional device. And the experimental result clearly shows that the PRAM with U-shaped bottom electrode has 35% smaller RESET current, compared with the conventional PRAM device.
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Document Type: Research Article
Publication date: 2008-10-01
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