Growth of Textured Nanocrystalline Cobalt Ferrite Thin Films by Pulsed Laser Deposition

Authors: Aditya, Lakshmikanta; Srivastava, A.; Sahoo, S. K.; Das, P.; Mukherjee, C.; Misra, Abha; Reddy, V. R.; Shinde, R. S.; Gupta, Ajay; Prasad, Shiva; Samajdar, I.; Nandedkar, R. V.; Venkataramani, N.

Source: Journal of Nanoscience and Nanotechnology, Volume 8, Number 8, August 2008 , pp. 4135-4140(6)

Publisher: American Scientific Publishers

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Cobalt ferrite thin films have been deposited on fused quartz substrates by pulsed laser deposition at various substrate temperatures, TS (25 °C, 300 °C, 550 °C and 750 °C). Single phase, nanocrystalline, spinel cobalt ferrite formation is confirmed by X-ray diffraction (XRD) for TS ≥ 300 °C. Conventional XRD studies reveal strong (111) texturing in the as deposited films with TS ≥ 550 °C. Bulk texture measurements using X-ray orientation distribution function confirmed (111) preferred orientation in the films with TS ≥ 550 °C. Grain size (13–16 nm for TS ≥ 300 °C) estimation using grazing incidence X-ray line broadening analysis shows insignificant grain growth with increasing TS, which is in good agreement with grain size data obtained from transmission electron microscopy.


Document Type: Research Article


Publication date: August 1, 2008

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