Resonant Raman and Micro-Raman Scattering from Si Matrix with Unburied -FeSi2 Nanolayers
Samples, representing Si matrix with nanolayers of the semiconducting -FeSi2 silicide are studied by Raman scattering. The unpolarized Raman spectra of the samples are measured in two different configurations. It is found that the characteristic -FeSi2 Raman modes are seen in the spectra, taken at incident angle of about 45°, while only comparatively intensive broad feature is detected in a back-scattering geometry. The difference in the spectra is interpreted with the appearance of surface polariton modes of the optical phonons in the nanosized layers in near back-scattering geometry. The resonant Raman scattering is investigated at incident light angle of about 45° and the energies of the interband transitions in the investigated energy range are determined. It is known that the resonant Raman scattering appears to be even more precise method for the determination of the interband transitions energies than the modulation spectroscopy. Thus we claim that the energies determined here are firstly determined with such a precision.
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Document Type: Research Article
Publication date: 2008-02-01
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