In-Situ Electrical Addressing of One-Dimensional Gold Nanoparticle Assemblies

Authors: Blech, Kerstin; Noyong, Michael; Juillerat, Frederic; Nakayama, Tomonobu; Hofmann, Heinrich; Simon, Ulrich

Source: Journal of Nanoscience and Nanotechnology, Volume 8, Number 1, January 2008 , pp. 461-465(5)

Publisher: American Scientific Publishers

Buy & download fulltext article:

OR

Price: $113.00 plus tax (Refund Policy)

Abstract:

Substrates with 1-dimensional nanosize grooves were prepared using extreme-ultraviolet interference lithography (EUV-IL), wherein gold nanoparticles were self-assembled to form 1-dimensional structures. To measure the electrical properties of gold nanoparticle chains we introduce a novel in-situ measuring method based on nanomanipulator system in a scanning electron microscope. This method comprises enormous versatility for the precisely electrical addressing of low-dimensional nanoscale structures and may even be applied to routinely addressing of structures in the sub-10 nm range.

Keywords: GOLD NANOPARTICLES; 1D ASSEMBLY; EUV-IL; ELECTRICAL CHARACTERIZATION; CONDUCTIVITY

Document Type: Short communication

DOI: http://dx.doi.org/10.1166/jnn.2008.192

Publication date: 2008-01-01

More about this publication?
  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
  • Editorial Board
  • Information for Authors
  • Subscribe to this Title
  • Terms & Conditions
  • ingentaconnect is not responsible for the content or availability of external websites
Related content

Tools

Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content

Text size:

A | A | A | A
Share this item with others: These icons link to social bookmarking sites where readers can share and discover new web pages. print icon Print this page