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Effects of Nonlinear Forces on Dynamic Mode Atomic Force Microscopy and Spectroscopy

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In this paper, we describe the effects of nonlinear tip–sample forces on dynamic mode atomic force microscopy and spectroscopy. The jumps and hysteresis observed in the vibration amplitude (A) versus tip–sample distance (h) curves have been traced to bistability in the resonance curve. A numerical analysis of the basic dynamic equation was used to explain the hysteresis in the experimental curve. It has been found that the location of the hysteresis in the Ah curve depends on the frequency of the forced oscillation relative to the natural frequency of the cantilever.


Document Type: Research Article


Publication date: June 1, 2007

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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