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Investigation of Ti Layer Thickness Dependent Structural, Magnetic, and Photoemission Study of Nanometer Range Ti/Ni Multilayer Structures

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Structural, magnetic, and electronic properties of Ti/Ni multilayer (ML) samples as a function of Ti layer thickness are studied and reported in this paper. For this purpose [Ti (t nm)/Ni (5nm)] × 10 ML samples, where t = 3, 5, and 7 nm have been deposited by using electron beam evaporation technique under UHV conditions at room temperature. Structure of ML samples were determined by using XRD (X-ray diffraction) technique and observed that Titanium is deposited mainly in amorphous nature with FCC structure at lower Ti layer thickness of 3 nm, which transform to crystalline HCP structures above than this Ti layer thickness. Corresponding fitted GIXRR (grazing incidence X-ray reflectivity) patterns shows asymmetric nature of Ti–Ni and Ni–Ti interfaces because of heavy intermixing and interdiffusion of Ni and Ti atoms at Ti–Ni interfaces at lower Ti layer thickness. The depth profiling core level and valence band measurements carried out by using XPS (X-ray photoelectron spectroscopy) technique confirms the interdiffusion and intermixing leading to Ti–Ni alloy phase formation at interfaces during deposition, particularly at lower Ti layer thickness of 3 nm. The corresponding magnetization behavior of ML samples has been investigated using Magneto-Optical Kerr Effect (MOKE) technique and observed that, coercitivity decreases while saturation magnetization increases with Ti layer thickness variations. These results are interpreted and discussed in terms of observed micro-structural changes due to Ti layer thickness vitiations in Ti/Ni multilayer samples.
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Keywords: ANNEALING EFFECT; INTERFACES PROPERTIES; MAGNETIZATION MEASUREMENTS; TI/NI MULTILAYER STRUCTURE

Document Type: Research Article

Publication date: 2007-06-01

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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