Thickness Dependent Structural, Magnetic and Transport Properties of Nanostructured Cobalt Thin Films

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Abstract:

This paper presents structural, magnetic, and transport properties measurements carried out on Co thin film as a function of thickness. The structure of the Co thin film changes from amorphous to nano-crystalline with the increase in film thickness. The corresponding magnetic and transport measurements show drastic changes in coercivity, saturation field and resistivity value as a function of Co film thickness. Observed magnetization and resistivity behaviour is mainly attributed to the (i)Change in crystal structure, (ii)stress relaxation, (iii)grain growth as revealed by X-ray diffraction (XRD), and atomic force microscopy (AFM) measurements.

Keywords: AFM; CO THIN FILM; MOKE; RESISTIVITY; XRD

Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jnn.2007.765

Publication date: June 1, 2007

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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