Measurement of Light Wavelength Based on Nanostructured Ordered Pore Arrays
A new method of light wavelength measurement is presented based on the nanostructured ordered pore arrays with multi-domains and centimeter square size formed by solution dipping-colloidal monolayer. Because of periodicity of the ordered pore arrays, perpendicular incidence of a parallel beam light on the array will lead to the diffraction spots or ring, depending on relative sizes of the beam and the domain in the arrays. The diffraction angle corresponds to wavelength of the incident light. On this basis, one can measure the wavelength of an incident light in transmission mode using such nanostructured ordered pore arrays, which is different from the conventional one fabricated from Michelson interference principle. Both the resolution and measurement precision can reach <1 nm in such a simple method. Comparatively, this new measurement setup is simple in structure, low in cost, convenient in measurement, and especially, small in size. It could be used for online demarcation and real-time measurement of light wavelength in such as, mine operation, seabed exploration, and even space exploration due to its miniature.
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Document Type: Research Article
Publication date: 2006-08-01
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- Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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