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Electronic Properties of a Single-Walled Carbon Nanotube/150mer-Porphyrin System Measured by Point-Contact Current Imaging Atomic Force Microscopy

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Abstract:

The electronic properties of a single-walled carbon nanotube/150mer of porphyrin polymer wire system were investigated. Current–voltage (IV) curves were measured simultaneously along with topographic observations using point-contact current imaging atomic force microscopy. Symmetric IV curves were obtained at bare single-walled carbon nanotubes but characteristic asymmetrical rectifying behavior was found at the single-walled carbon nanotube/150mer-porphyrin junctions. This finding is of key importance for the development of new nanoscale molecular electronic devices.

Keywords: CARBON NANOTUBE WIRING; MOLECULAR DEVICE; MOLECULAR RECTIFIER; PCI-AFM

Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jnn.2006.246

Publication date: June 1, 2006

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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