Electrical Characterization of Silicon Tips Using Conducting Atomic Force Microscopy
Authors: Xiao, Xinxing; Xiao, Zhongdang; Lu, Zuhong
Source: Journal of Nanoscience and Nanotechnology, Volume 5, Number 8, August 2005 , pp. 1277-1280(4)
Publisher: American Scientific Publishers
Abstract:The electrical properties of n-doped Si tips have been characterized in conducting atomic force microscopy under various conditions. Si tips with SiO2 layer on them present complex electric properties: which include a larger positive threshold bias, which is different from that of its doped semiconductor material. Silicon tips after removing their SiO2 layer had smaller positive threshold bias; such bias varied with the loading force: smaller loading forces corresponding to larger positive threshold biases, and it remained constant at lower levels for larger loading forces. Humidity of experiments influenced the threshold bias: lower relative humidities (<25%) and larger loading forces were in favor of getting stable threshold bias. The conductance increased remarkably in high relative humidity although it was kept in a narrow range when relative humidity was lower than 40%. Loading force didn't affect the conductance in the examined relative humidity conditions. One advantage of bare silicon tips over commercial conducting ones is that they smaller radius than gold-coated tips; this is in more favor of reaching single molecular electronics.
Document Type: Research Article
Publication date: August 1, 2005
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