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HAADF Imaging: An Effective Technique for the Study of NonhomogeneousNanostructures

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Abstract:

Atomic number contrast (Z-contrast) imaging using high-angle annular dark field (HAADF) detector, along with high resolution electron microscopy (HREM), is used to study the nanostructured metal, semiconductor, mixed oxide, and soft matter composites of inhomogeneous nature. A comparison between the HREMand HAADF images for the analysis of crystal structure, defects, and compositional inhomogenity in those nanostructures has been made. While the HREMtechnique is efficient in determining bulk crystallinity and defect structures, the HAADF imaging technique is superior in determining the surface inhomogenity, defect structures in the interior of the nanostructures, even at atomic resolution. The efficiency of the HAADF imaging technique in determining the surface inhomogenity and defect structures is demonstrated for the Au–Pt bimetallic clusters, CdSe nanofibers and nanowires, Nb16W18O94 mixed oxide, and polystyrene-mormorillonite clay nanocomposites.

Keywords: HAADF IMAGING; NANOSTRUCTURE; SEMICONDUCTORS; SOFT MATTER

Document Type: Short Communication

DOI: http://dx.doi.org/10.1166/jnn.2005.139

Publication date: July 1, 2005

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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