Nanoscopic Modeling of Fracture of 2D Graphene Systems
Authors: Jin, Y.; Yuan, F.G.
Source: Journal of Nanoscience and Nanotechnology, Volume 5, Number 4, April 2005 , pp. 601-608(8)
Publisher: American Scientific Publishers
Abstract:
Macroscopic fracture parameters are investigated on 2D graphene systems containing atomic-scale cracks. In the discrete atomistic simulations the interatomic forces are described by the Tersoff-Brenner potential. Two methods to calculate the elastic energy release rates in atomic systems,the global energy method and the local force method, are developed. The values of energy release rates of several graphene systems in symmetric (mode I) and antisymmetric (mode II) small deformation areobtained from atomistic simulations and then compared with the results obtained throughhomogenized material properties based on linear elastic fracture mechanics. The results show good agreement between discrete atomistic and continuum mechanics modeling for fracture. Meanwhile, atomic stress fields in front of crack tips are investigated through molecular mechanics simulationby applying remote K-field deformation. The atomic stress distributions match very well with those of linear elastic solutions.These establish connections of fracture parameters between microscopic and macroscopic description of fracture in covalently bonded solids.Keywords: ATOMISTIC SIMULATION; MOLECULAR MECHANICS; FRACTURE; NANO; ENERGY RELEASE RATE; STRESS INTENSITY FACTOR
Document Type: Research article
DOI: http://dx.doi.org/10.1166/jnn.2005.071
Publication date: 2005-04-01
- Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
- Editorial Board
- Information for Authors
- Subscribe to this Title
- Terms & Conditions
- ingentaconnect is not responsible for the content or availability of external websites
- In this: publication
- By this: publisher
- In this Subject: Technology
- By this author: Jin, Y. ; Yuan, F.G.

Shopping cart
Receive new issue alert
Get Permissions