Gold-Coated Conducting-Atomic Force Microscopy Probes

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Abstract:

Some aspects of the performance of gold-coated conductive probes used in conducting atomic force microscopy (C-AFM) technique are discussed. The resistance of the nanocontact between the gold-coated AFM tip and the graphite substrate has been monitored at various applied forces. For small forces (<50 nN), resistance on the order of a fewkiloohms was observed. Minimal contact resistance was observed for forces in the range 100–150 nN, beyond which the tip seems to undergo plastic deformation. The resistance of the nanocontact increased when current on the order of 100 A was allowed to pass through, finally resulting in melting of the gold coating. Keywords:

Keywords: CONDUCTING ATOMIC FORCE MICROSCOPY; CONDUCTIVE COATING; CONTACT FORCE; CURRENT BREAKDOWN; TIP MELTING

Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jnn.2005.066

Publication date: April 1, 2005

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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