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Statistical Characterization of Morphological Features of Layer-by-Layer Polymer Films by Image Analysis

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Abstract:

This article presents an image analysis-based approach to the statistical characterization of morphological features in layer-by-layer (LBL) polymer films, which depend on the experimental conditions of fabrication. The method is based on the recently introduced concept of exact dilations. This concept allows the precise determination of all possible parallel contours around any general object and, as a consequence, the respective fully accurate Voronoi partition defined by the objects. With the use of a fast wavefront propagation scheme, such diagrams can be obtained at high speed. The method has been applied to statistically characterize features such as grain size and distribution on LBL polymer films. To do this, the polymer surface is tracked from its highest z values downward to its bottom, and each new connected component is detected as a Voronoi seed. Through determination of equivalent radii of the Voronoi cells, the probability density function characterizing the distribution of the domain radius can then be obtained.

Keywords: ATOMIC FORCE MICROSCOPY; GRANULOMETRY; IMAGE ANALYSIS; POLYMER FILMS

Document Type: Research Article

DOI: https://doi.org/10.1166/jnn.2003.197

Publication date: 2003-06-01

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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