Structural Effects of Ti Underlayer on CoCrPt Magnetic Films
Keywords: COCRPT FILMS; TI UNDERLAYER; X-RAY SCATTERING; XANES
Document Type: Communications
Affiliations: 1: Department of Materials Science, National University of Singapore, Kent Ridge, Singapore 119260, Republic of Singapore 2: Data Storage Institute, Kent Ridge, Singapore 117543, Republic of Singapore 3: Institute of Physics, Academia of Sinica, Nankang, Taipei 11529, Taiwan 4: Department of Materials Science and Engineering, Sang-Ju National University, Sang-Ju, Kyongbuk, 742-711, South Korea 5: Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang, 790-784, South Korea 6: Department of Materials Science and Engineering, Kwangju Institute of Science and Technology, Kwangju, 500-712, South Korea
Publication date: 01 September 2001
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