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Structural Effects of Ti Underlayer on CoCrPt Magnetic Films

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The effects of long-range and short-range orders of Ti underlayer thickness on the magnetic properties of sputtered Co72Cr21Pt7 films were investigated using synchrotron X-ray scattering and X-ray absorption near-edge structure spectroscopy. The results were consistent with that of magnetic measurements and X-ray photoelectron spectroscopy. For thin Ti underlayers (10 nm), the oxidation of Ti and significant mixing of other elements within this underlayer did not promote texture development, further resulting in poor texturing of magnetic films and undesirable magnetic properties. Increased crystallinity and texture of metallic Ti in thicker underlayers enhanced the magnetic peak alignment and its properties.
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Keywords: COCRPT FILMS; TI UNDERLAYER; X-RAY SCATTERING; XANES

Document Type: Communications

Affiliations: 1: Department of Materials Science, National University of Singapore, Kent Ridge, Singapore 119260, Republic of Singapore 2: Data Storage Institute, Kent Ridge, Singapore 117543, Republic of Singapore 3: Institute of Physics, Academia of Sinica, Nankang, Taipei 11529, Taiwan 4: Department of Materials Science and Engineering, Sang-Ju National University, Sang-Ju, Kyongbuk, 742-711, South Korea 5: Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang, 790-784, South Korea 6: Department of Materials Science and Engineering, Kwangju Institute of Science and Technology, Kwangju, 500-712, South Korea

Publication date: 2001-09-01

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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