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Internet-Based Remote Nano-Characterization and Lithography Using Atomic Force Microscopy

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Abstract:

An internet-based nano-education module is developed for the remote characterization and modification of morphological and mechanical properties of materials. This module consists of an atomic force microscope (AFM), two computers linked through the internet, control software, and a webcam that helps to align samples. Authorized users can login to the computer that directly controls AFM from their locations to learn and use the AFM. The remote nano-module can facilitate learning without considering limits in space, facility hours, and contamination. A group of users has imaged several samples, processed obtained images using the software, and studied the morphological and mechanical properties of materials without going to an instrument room and even from another country.

Keywords: ATOMIC FORCE MICROSCOPY; IMAGING; LITHOGRAPHY; REMOTE CONTROL

Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jne.2010.1005

Publication date: June 1, 2010

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  • The Journal of Nano Education (JNE) is a peer-reviewed international journal that aims to provide the most complete and reliable source of information on current developments in nanoscale science, technology, engineering, and medical education.
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