Skip to main content

Internet-Based Remote Nano-Characterization and Lithography Using Atomic Force Microscopy

Buy Article:

$113.00 plus tax (Refund Policy)


An internet-based nano-education module is developed for the remote characterization and modification of morphological and mechanical properties of materials. This module consists of an atomic force microscope (AFM), two computers linked through the internet, control software, and a webcam that helps to align samples. Authorized users can login to the computer that directly controls AFM from their locations to learn and use the AFM. The remote nano-module can facilitate learning without considering limits in space, facility hours, and contamination. A group of users has imaged several samples, processed obtained images using the software, and studied the morphological and mechanical properties of materials without going to an instrument room and even from another country.


Document Type: Research Article


Publication date: 2010-06-01

More about this publication?
  • The Journal of Nano Education (JNE) is a peer-reviewed international journal that aims to provide the most complete and reliable source of information on current developments in nanoscale science, technology, engineering, and medical education.
  • Editorial Board
  • Information for Authors
  • Subscribe to this Title
  • Ingenta Connect is not responsible for the content or availability of external websites
  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more