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Evaluation of 3D Carbon Nanotube Composite Atomic Force Microscopy Probes Fabricated with Ion Flux Molding

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The performance of carbon nanotube-carbon nanotube composite (CNT/CNT composite) atomic force microscopy (AFM) probes aligned by using ion flux molding (IFM) processing is compared to that of conventional Si probes in atomic force microscopy (tapping mode). Comparison data reveal that IFM treated CNT/CNT composite probes improve image accuracy, tip longevity and allow higher aspect ratio imaging of 3D surface features.
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Keywords: ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; ION FLUX MOLDING

Document Type: Research Article

Publication date: 2016-12-01

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  • Journal of Advanced Microscopy Research (JAMR) provides a forum for rapid dissemination of important developments in high-resolution microscopy techniques to image, characterize and analyze man-made and natural samples; to study physicochemical phenomena such as abrasion, adhesion, corrosion and friction; to perform micro and nanofabrication, lithography, patterning, micro and nanomanipulation; theory and modeling, as well as their applications in all areas of science, engineering, and medicine.
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