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Evaluating Nanoprofiles of Materials Deposited on Waveguides by an Evanescent Light Method

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Abstract:

The photon extraction efficiency of evanescent light from various materials was used to evaluate the thickness profiles of insulator, semiconductor and conductor nano layers deposited on glass waveguides. It was found that the effective evanescent photon penetration depth increases from metal to semiconductor and then to insulating layers, corresponding to the evanescent-photon-material effective interaction for the various materials classes.

Keywords: EVANESCENT PHOTON PENETRATION DEPTH; EVANESCENT WAVE IMAGING; NANOFILMS

Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jamr.2012.1094

Publication date: March 1, 2012

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  • Journal of Advanced Microscopy Research (JAMR) provides a forum for rapid dissemination of important developments in high-resolution microscopy techniques to image, characterize and analyze man-made and natural samples; to study physicochemical phenomena such as abrasion, adhesion, corrosion and friction; to perform micro and nanofabrication, lithography, patterning, micro and nanomanipulation; theory and modeling, as well as their applications in all areas of science, engineering, and medicine.
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