Microstructure and Composition of Sn1–x Pb x S Films and Whiskers Grown by Hot Wall Technique
Abstract:Sn1–x Pb x S (0.08 ≤ x ≤ 0.16) thin films and whiskers with orthorhombic crystal structure of α-SnS were produced by hot wall vacuum deposition method (HWVD). The whiskers grew via a self-consuming vapor–liquid–solid (VLS) mechanism by means of Sn-droplets onto the surface of an underlying thin film which is build by differently oriented blocks. As revealed by transmission electron microscopy (TEM) and energy dispersive X-ray spectroscopy (EDX) experiments there is no composition gradient across the whiskers and the underlying thin film. TEM and X-ray analysis showed that the whiskers and polycrystalline thin films have a preferential orientation along  perpendicular to the substrate surface. Scanning electron microscopy investigations indicate a strong dependence of whiskers growth on the lead concentration and substrate temperature. Increasing Pb content the substrate temperature has to be increased to realize whisker growth via VLS.
Document Type: Research Article
Publication date: 2011-02-01
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- Journal of Advanced Microscopy Research (JAMR) provides a forum for rapid dissemination of important developments in high-resolution microscopy techniques to image, characterize and analyze man-made and natural samples; to study physicochemical phenomena such as abrasion, adhesion, corrosion and friction; to perform micro and nanofabrication, lithography, patterning, micro and nanomanipulation; theory and modeling, as well as their applications in all areas of science, engineering, and medicine.
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