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Imaging of Nanometric Ferroelectric Domains in BaTiO3 Using Atomic Force Acoustic Microscopy and Piezo Force Microscopy

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Abstract:

The present work deals with study of local elastic and electromechanical response from a BaTiO3 pellet using Atomic Force Acoustic Microscopy (AFAM) and Piezo Force Microscopy (PFM). A commercial multi-mode Scanning Probe Microscopy (SPM) was used for the above purpose. The AFAM mode was used to image contact stiffness. Stiffness parameters as well as young's modulii were quantitatively determined. PFM studies were based on electrostatic and electromechanical response from localized tip-surface contact. These investigations also yielded values of piezo coefficients and young's modulus. The Young's modulii obtained from AFAM and PFM were compared. In addition, poling behaviour, obtained by applying –10 V to +10 V local voltage, was analyzed from phase and amplitude contrast images.

Keywords: ATOMIC FORCE ACOUSTIC MICROSCOPY; BATIO3; PIEZO FORCE MICROSCOPY

Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jamr.2011.1056

Publication date: February 1, 2011

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  • Journal of Advanced Microscopy Research (JAMR) provides a forum for rapid dissemination of important developments in high-resolution microscopy techniques to image, characterize and analyze man-made and natural samples; to study physicochemical phenomena such as abrasion, adhesion, corrosion and friction; to perform micro and nanofabrication, lithography, patterning, micro and nanomanipulation; theory and modeling, as well as their applications in all areas of science, engineering, and medicine.
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