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Journal of Advanced Microscopy Research (JAMR) provides a forum for rapid dissemination of important developments in high-resolution microscopy techniques to image, characterize and analyze man-made and natural samples; to study physicochemical phenomena such as abrasion, adhesion, corrosion and friction; to perform micro and nanofabrication, lithography, patterning, micro and nanomanipulation; theory and modeling, as well as their applications in all areas of science, engineering, and medicine.

Journal of Advanced Microscopy Research was previously published as Journal of Scanning Probe Microscopy.

Publisher: American Scientific Publishers

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Volume 5, Number 3, December 2010

Review

Atomic Force Microscopy of Extraterrestrial Samples
pp. 159-176(18)
Authors: Contreras-Torres, Flavio F.; Basiuk, Elena V.; Rodríguez-Galván, Andrés

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Research Articles

Imaging Bacteriophage T4 Interacting with a Polyethyleneimine Layer by Atomic Force Microscopy: Evidences of Substructures
pp. 177-180(4)
Authors: Tiliket, Ghania; Lebrun, Laurent; Nguyen, Trong; Valleton, Jean-Marc

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Oxidation of a Single-Crystal Ni-Base Superalloy SRR99 at High Temperatures
pp. 190-195(6)
Authors: Liu, Chunting; Ma, Ji; Yao, Xudan

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Influence of Microwave Energy on Structural and Piezoelectric Response of Bi4Ti3O12 Ceramics
pp. 209-216(8)
Authors: Aguiar, Ederson Carlos; Simões, Alexandre Zirpoli; Longo, Elson; Varela, José Arana

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Microscopic and Dielectric Analyses of Vanadium and Tungsten Modified Barium Zirconium Titanate Ceramics
pp. 223-231(9)
Authors: Moura, Francisco; Simões, Alexandre Zirpoli; Zaghete, Maria Aparecida; Varela, José Arana; Longo, Elson

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