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Journal of Advanced Microscopy Research (JAMR) provides a forum for rapid dissemination of important developments in high-resolution microscopy techniques to image, characterize and analyze man-made and natural samples; to study physicochemical phenomena such as abrasion, adhesion, corrosion and friction; to perform micro and nanofabrication, lithography, patterning, micro and nanomanipulation; theory and modeling, as well as their applications in all areas of science, engineering, and medicine.

Journal of Advanced Microscopy Research was previously published as Journal of Scanning Probe Microscopy.

Publisher: American Scientific Publishers

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Volume 5, Number 2, August 2010

Reviews

The Role of Atomic Force Microscopy in Nanoparticle Research
pp. 67-77(11)
Authors: Vůjtek, Milan; Kubínek, Roman; Zbořil, Radek

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Research Articles

Neuropil Fiber Reduction in Brain Tumors Observed by Atomic Force Microscopy
pp. 86-90(5)
Authors: Schilcher, Kurt; Silye, René; Huber, Hans-Peter

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The Spines of Sand Dollar Scaphechinus mirabilis (Agassiz 1863): Analytical and Structural Study
pp. 100-109(10)
Authors: Ehrlich, Hermann; Elkin, Yury N.; Artyukov, Alexandr A.; Kozlovskaya, Emma; Stonik, Valentin A.; Safronov, Petr P.; Kurek, Denis V.; Bazhenov, Vasily V.; Kummer, Kurt; Vyalikh, Denis; Molodtsov, Serguei L.; Sivkov, Viktor N.; Born, René; Ruhnow, Michael; Meissner, Heike; Richter, Gert

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Crystallographic Phase and Orientation Analysis of GaAs Nanowires by Electron Microscopy Methods
pp. 110-115(6)
Authors: Tonejc, A. M.; Gradečak, S.; Tonejc, A.; Bijelić, M.; Tambe, M.

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Microscopic and Optical Characterization of Cd0.8Zn0.2S Thin Film
pp. 123-128(6)
Authors: Prem Kumar, T.; Rajasekar, S.; Saravanakumar, S.; Joseph, P. S.; Sankaranarayanan, K.

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Towards the Determination of Surface Energy at the Nanoscale: A Further Assessment of the AFM-Based Approach
pp. 137-142(6)
Authors: Lamprou, Dimitrios A.; Smith, James R.; Nevell, Thomas G.; Barbu, Eugen; Willis, Colin R.; Tsibouklis, John

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Rietveld Analyses and Piezoelectric Properties of Niobium Doped Bismuth Titanate Systems
pp. 149-157(9)
Authors: Aguiar, Éderson Carlos; Simões, Alexandre Zirpoli; Longo, Elson; Varela, J. A.

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