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Detection of Low-Density Ge Nanoparticles Using Surface-Enhanced Raman Spectroscopy

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We demonstrate the sensitive detection and structural characterization of extremely low density Ge nanoparticles by surface-enhanced Raman spectroscopy (SERS). Ge films of monolayer coverage are fabricated by a gas evaporation technique and are deposited onto quartz and various metal substrates. The nanoparticle size and density, as obtained by transmission electron microscopy, are in the range of 6–9 nm and ∼1.2 × 1011 cm−2 respectively. The Raman intensity for the Ge films deposited on metal substrates (Ag, Au, or Al) shows a dramatic enhancement (for example, a factor of a few hundred for Ag) as compared to quartz substrates. Further, the Raman intensity enhancement from the different metals is understood in terms of contributions from interband transitions to the dielectric function in the visible excitation region used for Raman measurements. The observation of enhanced Raman signals from such low-density NP films shows the potential of non-invasive Raman spectroscopy for the study of optical and structural properties of nanoscale devices.

Document Type: Research Article


Publication date: September 1, 2009

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  • ADVANCED SCIENCE LETTERS is an international peer-reviewed journal with a very wide-ranging coverage, consolidates research activities in all areas of (1) Physical Sciences, (2) Biological Sciences, (3) Mathematical Sciences, (4) Engineering, (5) Computer and Information Sciences, and (6) Geosciences to publish original short communications, full research papers and timely brief (mini) reviews with authors photo and biography encompassing the basic and applied research and current developments in educational aspects of these scientific areas.
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