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Erasing Performance of Phase-Change Materials for Scanning Probe Applications

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The erasable performance of a scanning probe phase-change memory from the amorphous to the crystalline phase or vice versa is investigated here in light of a previously developed 2D comprehensive model. The simulation results demonstrate the feasibility of erasing amorphous bits from a crystalline background using the scanning probe phase-change memory under low power consumption. Erasing crystalline bits from an amorphous background is found to be problematic due to the presence of the unwanted transformation of the crystalline 'ring'. Such a drawback can be however effectively overcome using either 'patterned' media or slow crystal growth material, according to a newly developed nucleation-growth model.

Keywords: ERASE; GROWTH; NUCLEATION; PHASE-CHANGE MEDIA; SCANNING PROBE

Document Type: Review Article

Publication date: 01 September 2013

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  • Advanced Science Focus is a multidisciplinary peer-reviewed journal with a very wide- ranging coverage, consolidates fundamental and applied research activities in all areas of (1) Physical Sciences/Chemistry/Physics/Astronomy, (2) Engineering, (3) Biological Sciences, (4) Health Sciences, (5) Biomedical Sciences, (6) Medicine, (7) Agriculture Science and Engineering, (8) Veterinary Science, (9) Marine Science, (10) Wild Life and Forestry, (11) World Natural Resources (12) Nutrition and Food Science, (13) Mathematical Sciences, (14) Computer and Information Sciences, (15) Geosciences/Earth Science, (16) Atmospheric Sciences and Meteorology, (17) Energy Science and Technology, (18) Environmental Science/Green Science, Engineering and Technology, (19) Business Management, (20) Social Sciences, (21) Humanities/Anthropology, (22) Education, and (23) Public Policies and much more.
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