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Stress-Induced Birefringence in All-Fiber White-Light Interferometers

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Abstract:

The phenomenon of the interference pattern splitting in an all-fiber white-light interferometer is investigated. It is found that the interference pattern will change its amplitude and shape as the fiber which forms the optical path is subjected to tension, bending, or torsion. This leads to the interference pattern fading and deteriorates the zero-order fringe identification. An explanation based on the stress-induced birefringence is presented with numerical simulation results. It is shown that the periodic change in the amplitude and shape results from the periodically changed phase difference between the two orthogonal LP01 modes in the presence of external loads.

Document Type: Research Article

Affiliations: 1: Department of Mechanical Engineering, University of Maryland, College Park, Maryland, 20742 2: Department of Electronic Engineering, Tsinghua University, Beijing, 100084, People's Republic of China

Publication date: July 1, 1998

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