Slurry Atomization of Wheat-Milled Fractions for Electrothermal Atomic Absorption Spectrometric Determination of Nickel and Chromium
Abstract:A slurry electrothermal atomic absorption spectrometric technique was used to determine Ni and Cr in wheat flour and its by-products. Slurries (3%, w/v) were prepared in a mixture of 15% HNO3–10% H2O2 as suspended medium. Differences in Ni and Cr contents due to origin and texture of the wheat and to the effects of the milling process were studied. Ni and Cr levels were more markedly influenced by the geographical origin of the wheat than by its texture. Both metals were related to the amount of bran present in each milled fraction and varied over the ranges of 212–298 ng/g (Ni) and 34–85 ng/g (Cr) in flours (with minimal bran contents); 297–460 ng/g (Ni) and 67–118 ng/g (Cr) in shorts; and 424–723 ng/g (Ni) and 106–165 ng/g (Cr) in brans. The Ni and Cr contents were not significantly affected by the technological processes typically performed in a flour-producing factory.
Document Type: Research Article
Publication date: November 1, 2001
More about this publication?
- The Journal of AOAC INTERNATIONAL publishes refereed papers and reviews in the fields of chemical, biological and toxicological analytical chemistry for the purpose of showcasing the most precise, accurate and sensitive methods for analysis of foods, food additives, supplements and contaminants, cosmetics, drugs, toxins, hazardous substances, pesticides, feeds, fertilizers and the environment available at that point in time. The scope of the Journal includes unpublished original research describing new analytical methods, techniques and applications; improved approaches to sampling, both in the field and the laboratory; better methods of preparing samples for analysis; collaborative studies substantiating the performance of a given method; statistical techniques for evaluating data. The Journal will also publish other articles of general interest to its audience, e.g., technical communications; cautionary notes; comments on techniques, apparatus, and reagents.
- Information for Authors
- Submit a Paper
- Subscribe to this Title
- Information for Advertisers
- Journal Information
- ingentaconnect is not responsible for the content or availability of external websites